000 00495nam a2200157Ia 4500
008 241217s9999||||xx |||||||||||||| ||und||
020 _a71002081
_c29.5
040 _beng
_cSSK Library
_erda
082 _a005.14/MUS
100 _a John D. Musa, Anthony Iannino & Kazuhira Okumoto
245 0 _aSoftware Reliability: Measurement, Prediction, Application
260 _b Mcgraw Hill Book Company
_c©1987
942 _2Dewey Decimal Classification
_cBOOK
_nNo
999 _c25251
_d25251
003 OSt
005 20241217112946.0